TY - GEN
T1 - Improved circuits for microchip identification using SRAM mismatch
AU - Chellappa, Srivatsan
AU - Dey, Aritra
AU - Clark, Lawrence T.
PY - 2011/11/9
Y1 - 2011/11/9
N2 - Integrated circuit authentication requires identification using un-clonable digital fingerprints. SRAM power-up state is one such fingerprinting method. In this paper we present a new, more robust hardware technique for generating secret keys and unique serial numbers using SRAM cells' inherent mismatch due to process variations in the constituent transistors. The improved method can be used in operation and is amenable to devices using power-up BIST. It is experimentally demonstrated and analyzed on a 90 nm test chip.
AB - Integrated circuit authentication requires identification using un-clonable digital fingerprints. SRAM power-up state is one such fingerprinting method. In this paper we present a new, more robust hardware technique for generating secret keys and unique serial numbers using SRAM cells' inherent mismatch due to process variations in the constituent transistors. The improved method can be used in operation and is amenable to devices using power-up BIST. It is experimentally demonstrated and analyzed on a 90 nm test chip.
UR - http://www.scopus.com/inward/record.url?scp=80455156107&partnerID=8YFLogxK
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U2 - 10.1109/CICC.2011.6055318
DO - 10.1109/CICC.2011.6055318
M3 - Conference contribution
AN - SCOPUS:80455156107
SN - 9781457702228
T3 - Proceedings of the Custom Integrated Circuits Conference
BT - 2011 IEEE Custom Integrated Circuits Conference, CICC 2011
T2 - 33rd Annual Custom Integrated Circuits Conference - The Showcase for Circuit Design in the Heart of Silicon Valley, CICC 2011
Y2 - 19 September 2011 through 21 September 2011
ER -