Impact of neutron-induced displacement damage on the ATREE Response in LM124 operational amplifier

Fabien Roig; L. Dusseau; P. Ribeiro; G. Auriel; N. J.H. Roche; A. Privat; J. R. Vaille; J. Boch; F. Saigne; R. Marec; P. Calvel; F. Bezerra; R. Ecoffet; B. Azais

doi:10.1109/TNS.2014.2365048

Impact of neutron-induced displacement damage on the ATREE Response in LM124 operational amplifier

Fabien Roig
, L. Dusseau
, P. Ribeiro
, G. Auriel
, N. J.H. Roche
, A. Privat
, J. R. Vaille
, J. Boch
, F. Saigne
, R. Marec
, P. Calvel
, F. Bezerra
, R. Ecoffet
, B. Azais

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

The synergistic effect between displacement damage dose (DDD) and analog transient radiation effects on electronics (ATREE) in an operational amplifier (LM124) (opamp) from three different manufacturers is investigated. Pulsed X-ray experiments have highlighted ATREE sensitivity on devices significantly more important following exposure to fission neutrons than for unirradiated devices. A previously developed simulation tool is used to model ATREE responses taking into account the electrical parameters degradation due to displacement damage phenomenon. A good agreement is observed between model outputs and experimental ATREE results.

Original language	English (US)
Article number	6949159
Pages (from-to)	3043-3049
Number of pages	7
Journal	IEEE Transactions on Nuclear Science
Volume	61
Issue number	6
DOIs	https://doi.org/10.1109/TNS.2014.2365048
State	Published - Dec 1 2014
Externally published	Yes

Keywords

Bipolar analog integrated circuits
X-ray effects
circuit modeling
displacement damage
total non-ionizing dose
transient radiation effects
transient response

ASJC Scopus subject areas

Nuclear and High Energy Physics
Nuclear Energy and Engineering
Electrical and Electronic Engineering

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10.1109/TNS.2014.2365048

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Roig, F., Dusseau, L., Ribeiro, P., Auriel, G., Roche, N. J. H., Privat, A., Vaille, J. R., Boch, J., Saigne, F., Marec, R., Calvel, P., Bezerra, F., Ecoffet, R., & Azais, B. (2014). Impact of neutron-induced displacement damage on the ATREE Response in LM124 operational amplifier. IEEE Transactions on Nuclear Science, 61(6), 3043-3049. Article 6949159. https://doi.org/10.1109/TNS.2014.2365048

Roig, F, Dusseau, L, Ribeiro, P, Auriel, G, Roche, NJH, Privat, A, Vaille, JR, Boch, J, Saigne, F, Marec, R, Calvel, P, Bezerra, F, Ecoffet, R & Azais, B 2014, 'Impact of neutron-induced displacement damage on the ATREE Response in LM124 operational amplifier', IEEE Transactions on Nuclear Science, vol. 61, no. 6, 6949159, pp. 3043-3049. https://doi.org/10.1109/TNS.2014.2365048

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abstract = "The synergistic effect between displacement damage dose (DDD) and analog transient radiation effects on electronics (ATREE) in an operational amplifier (LM124) (opamp) from three different manufacturers is investigated. Pulsed X-ray experiments have highlighted ATREE sensitivity on devices significantly more important following exposure to fission neutrons than for unirradiated devices. A previously developed simulation tool is used to model ATREE responses taking into account the electrical parameters degradation due to displacement damage phenomenon. A good agreement is observed between model outputs and experimental ATREE results.",

keywords = "Bipolar analog integrated circuits, X-ray effects, circuit modeling, displacement damage, total non-ionizing dose, transient radiation effects, transient response",

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AU - Roche, N. J.H.

AU - Privat, A.

AU - Vaille, J. R.

AU - Boch, J.

AU - Saigne, F.

AU - Marec, R.

AU - Calvel, P.

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KW - X-ray effects

KW - circuit modeling

KW - displacement damage

KW - total non-ionizing dose

KW - transient radiation effects

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Impact of neutron-induced displacement damage on the ATREE Response in LM124 operational amplifier

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Keywords

ASJC Scopus subject areas

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