High resolution electron beam profile monitor

William Graves, E. D. Johnson, P. G. O'Shea

Research output: Chapter in Book/Report/Conference proceedingChapter

6 Scopus citations


A new beam diagnostic to measure transverse profiles of electron beams is described. This profile monitor uses a Yttrium:Aluminum:Garnet (YAG) crystal doped with a visible-light scintillator to produce an image of the transverse beam distribution. The advantage of this material over traditional fluorescent screens is that it is formed from a single crystal, and therefore has improved spatial resolution. The current system is limited to a resolution of about 10 microns. Improvements in the optical transport will enable measurements of RMS beam sizes of less than 1 micron. The total cost of the system is modest.

Original languageEnglish (US)
Title of host publicationProceedings of the IEEE Particle Accelerator Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages3
StatePublished - 1998
Externally publishedYes
EventProceedings of the 1997 17th Particle Accelerator Conference, PAC-97 - Vancouver, BC, CAN
Duration: May 12 1997May 16 1997


OtherProceedings of the 1997 17th Particle Accelerator Conference, PAC-97
CityVancouver, BC, CAN

ASJC Scopus subject areas

  • General Engineering


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