Abstract
A review of high fan-in circuit design in contemporary logic technologies is presented. This is followed by a description of a BiNMOS circuit structure which allows the construction of large fan-in, dynamic logical NAND or OR functions. Power and reliability considerations such as BJT reverse Vbe and MOS hot electron protection are included. Application of the circuit in the 3.3V, 100MHz, implementation of the PentiumTM Microprocessor [1] on a 0.6 mm BiNMOS process [2] is discussed.
Original language | English (US) |
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Title of host publication | IEEE Bipolar/BiCMOS Circuits and Technology Meeting |
Editors | C.R. Selvakumar |
Pages | 27-32 |
Number of pages | 6 |
State | Published - 1994 |
Externally published | Yes |
Event | Proceedings of the 1994 Bipolar/BiCMOS Circuits and Technology Meeting - Minneapolis, MN, USA Duration: Oct 10 1994 → Oct 11 1994 |
Other
Other | Proceedings of the 1994 Bipolar/BiCMOS Circuits and Technology Meeting |
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City | Minneapolis, MN, USA |
Period | 10/10/94 → 10/11/94 |
ASJC Scopus subject areas
- Engineering(all)