TY - GEN
T1 - Hierarchical variance analysis for analog circuits based on graph modelling and correlation loop tracing
AU - Liu, Fang
AU - Flomenberg, Jacob J.
AU - Yasaratne, Devaka V.
AU - Ozev, Sule
PY - 2005
Y1 - 2005
N2 - Process variations play an increasingly important role on the success of analog circuits. State-of-the-art analog circuits are based on complex architectures and contain many hierarchical layers and parameters. Knowledge of the parameter variances and their contribution patterns is crucial for a successful design process. This information is valuable to find solutions for many problems in design, design automation, testing, and fault tolerance. In this paper, we present a hierarchical variance analysis methodology for analog circuits. In the proposed method, we make use of previously computed values whenever possible so as to reduce computational time. Experimental results indicate that the proposed method provides both accuracy and computational efficiency when compared with prior approaches.
AB - Process variations play an increasingly important role on the success of analog circuits. State-of-the-art analog circuits are based on complex architectures and contain many hierarchical layers and parameters. Knowledge of the parameter variances and their contribution patterns is crucial for a successful design process. This information is valuable to find solutions for many problems in design, design automation, testing, and fault tolerance. In this paper, we present a hierarchical variance analysis methodology for analog circuits. In the proposed method, we make use of previously computed values whenever possible so as to reduce computational time. Experimental results indicate that the proposed method provides both accuracy and computational efficiency when compared with prior approaches.
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U2 - 10.1109/DATE.2005.175
DO - 10.1109/DATE.2005.175
M3 - Conference contribution
AN - SCOPUS:33646918905
SN - 0769522882
SN - 0769522882
SN - 9780769522883
T3 - Proceedings -Design, Automation and Test in Europe, DATE '05
SP - 126
EP - 131
BT - Proceedings - Design, Automation and Test in Europe, DATE '05
T2 - Design, Automation and Test in Europe, DATE '05
Y2 - 7 March 2005 through 11 March 2005
ER -