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Graded-thickness samples for molecular beam epitaxial growth studies of GaAs/Si heteroepitaxy
- D. K. Biegelsen
- , F. A. Ponce
- , B. S. Krusor
- , J. C. Tramontana
- , R. D. Yingling
Research output: Contribution to journal › Article › peer-review
20
Scopus
citations