GENERAL CHARACTERISTIC FLUORESCENCE CORRECTION FOR PARTICLES, THIN FILMS, AND THICK SPECIMENS.

J. T. Armstrong; P R Buseck

GENERAL CHARACTERISTIC FLUORESCENCE CORRECTION FOR PARTICLES, THIN FILMS, AND THICK SPECIMENS.

J. T. Armstrong
, P R Buseck

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A rigorous, general characteristic fluorescence correction for electron microprobe analysis of samples of given geometry has been developed, and specific versions of this equation have been formulated for calculation of the flourescence produced in thin films and spherical particles. These equations are evaluated for representative matrices having large characteristic fluorescence corrections and the results are compared with existing empirical correction equations.

Original language	English (US)
Title of host publication	Proceedings, Annual Conference - Microbeam Analysis Society
Editors	Alton D.Jr. Romig, Joseph I. Goldstein
Pages	231-214
Number of pages	18
State	Published - 1984
Externally published	Yes

ASJC Scopus subject areas

General Engineering

Cite this

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title = "GENERAL CHARACTERISTIC FLUORESCENCE CORRECTION FOR PARTICLES, THIN FILMS, AND THICK SPECIMENS.",

abstract = "A rigorous, general characteristic fluorescence correction for electron microprobe analysis of samples of given geometry has been developed, and specific versions of this equation have been formulated for calculation of the flourescence produced in thin films and spherical particles. These equations are evaluated for representative matrices having large characteristic fluorescence corrections and the results are compared with existing empirical correction equations.",

author = "Armstrong, \{J. T.\} and Buseck, \{P R\}",

year = "1984",

language = "English (US)",

pages = "231--214",

editor = "Romig, \{Alton D.Jr.\} and Goldstein, \{Joseph I.\}",

booktitle = "Proceedings, Annual Conference - Microbeam Analysis Society",

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AU - Armstrong, J. T.

AU - Buseck, P R

PY - 1984

Y1 - 1984

N2 - A rigorous, general characteristic fluorescence correction for electron microprobe analysis of samples of given geometry has been developed, and specific versions of this equation have been formulated for calculation of the flourescence produced in thin films and spherical particles. These equations are evaluated for representative matrices having large characteristic fluorescence corrections and the results are compared with existing empirical correction equations.

AB - A rigorous, general characteristic fluorescence correction for electron microprobe analysis of samples of given geometry has been developed, and specific versions of this equation have been formulated for calculation of the flourescence produced in thin films and spherical particles. These equations are evaluated for representative matrices having large characteristic fluorescence corrections and the results are compared with existing empirical correction equations.

UR - https://www.scopus.com/pages/publications/0021654453

UR - https://www.scopus.com/pages/publications/0021654453#tab=citedBy

M3 - Conference contribution

AN - SCOPUS:0021654453

SP - 231

EP - 214

BT - Proceedings, Annual Conference - Microbeam Analysis Society

A2 - Romig, Alton D.Jr.

A2 - Goldstein, Joseph I.

ER -

GENERAL CHARACTERISTIC FLUORESCENCE CORRECTION FOR PARTICLES, THIN FILMS, AND THICK SPECIMENS.

Abstract

ASJC Scopus subject areas

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