TY - GEN
T1 - FSAF
T2 - 2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09
AU - Mylavarapu, Sai Krishna
AU - Choudhuri, Siddharth
AU - Shrivastava, Aviral
AU - Jongeun, Lee
AU - Givargis, Tony
PY - 2009
Y1 - 2009
N2 - NAND Flash Memories require Garbage Collection (GC) and Wear Leveling (WL) operations to be carried out by Flash Translation Layers (FTLs) that oversee flash management. Owing to expensive erasures and data copying, these two operations essentially determine application response times. Since file systems do not share any file deletion information with FTL, dead data is treated as valid by FTL, resulting in significant WL and GC overheads. In this work, we propose a novel method to dynamically interpret and treat dead data at the FTL level so as to reduce above overheads and improve application response times, without necessitating any changes to existing file systems. We demonstrate that our resourceefficient approach can improve application response times and memory write access times by 22% and reduce erasures by 21.6% on average.
AB - NAND Flash Memories require Garbage Collection (GC) and Wear Leveling (WL) operations to be carried out by Flash Translation Layers (FTLs) that oversee flash management. Owing to expensive erasures and data copying, these two operations essentially determine application response times. Since file systems do not share any file deletion information with FTL, dead data is treated as valid by FTL, resulting in significant WL and GC overheads. In this work, we propose a novel method to dynamically interpret and treat dead data at the FTL level so as to reduce above overheads and improve application response times, without necessitating any changes to existing file systems. We demonstrate that our resourceefficient approach can improve application response times and memory write access times by 22% and reduce erasures by 21.6% on average.
UR - http://www.scopus.com/inward/record.url?scp=70350062090&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=70350062090&partnerID=8YFLogxK
U2 - 10.1109/date.2009.5090696
DO - 10.1109/date.2009.5090696
M3 - Conference contribution
AN - SCOPUS:70350062090
SN - 9783981080155
T3 - Proceedings -Design, Automation and Test in Europe, DATE
SP - 399
EP - 404
BT - Proceedings - 2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 20 April 2009 through 24 April 2009
ER -