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Fluctuation microscopy analysis of amorphous silicon models
J. M. Gibson,
M. M.J. Treacy
Physics
Research output
:
Contribution to journal
›
Article
›
peer-review
7
Scopus citations
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Engineering & Materials Science
Amorphous silicon
100%
Electron microscopy
94%
Microscopic examination
79%
Amorphous semiconductors
69%
Composite materials
42%
Volume fraction
32%
Medicine & Life Sciences
Silicon
88%
Electron Microscopy
63%
Microscopy
61%
Semiconductors
52%
Computer Simulation
34%
Chemical Compounds
Amorphous Silicon
99%
Electron Microscopy
63%
Composite Material
36%
Semiconductor
27%
Amorphous Material
25%
Length
21%
Volume
21%
Physics & Astronomy
amorphous silicon
67%
electron microscopy
63%
microscopy
51%
amorphous semiconductors
46%
composite materials
44%