Fluctuation microscopy: A technique for revealing atomic correlations in structurally noisy (disordered) materials

Michael Treacy; J. M. Gibson

doi:10.1117/12.497805

Fluctuation microscopy: A technique for revealing atomic correlations in structurally noisy (disordered) materials

Michael Treacy, J. M. Gibson

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

Fluctuation microscopy is a hybrid diffraction-imaging technique that yields information about higher-order correlations between structural units in materials. It has been shown to be well suited for detecting medium range order in atomic positions in amorphous materials. This article presents a review of fluctuation microscopy as employed in a transmission electron microscope for the study of amorphous tetrahedral semiconductors. Possible extensions of the technique to other radiations such as x-rays, and for other structurally noisy materials such as polymers and starches, are discussed.

Original language	English (US)
Title of host publication	Proceedings of SPIE - The International Society for Optical Engineering
Editors	M.B. Weissman, N.E. Israeloff, A.S. Kogan
Pages	48-60
Number of pages	13
Volume	5112
DOIs	https://doi.org/10.1117/12.497805
State	Published - 2003
Externally published	Yes
Event	Noise as a Tool for Studying Materials - Santa Fe, NM, United States Duration: Jun 2 2003 → Jun 4 2003

Other

Other	Noise as a Tool for Studying Materials
Country/Territory	United States
City	Santa Fe, NM
Period	6/2/03 → 6/4/03

ASJC Scopus subject areas

Electrical and Electronic Engineering
Condensed Matter Physics

Access to Document

10.1117/12.497805

Cite this

Fluctuation microscopy: A technique for revealing atomic correlations in structurally noisy (disordered) materials. / Treacy, Michael; Gibson, J. M.
Proceedings of SPIE - The International Society for Optical Engineering. ed. / M.B. Weissman; N.E. Israeloff; A.S. Kogan. Vol. 5112 2003. p. 48-60.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Treacy, M & Gibson, JM 2003, Fluctuation microscopy: A technique for revealing atomic correlations in structurally noisy (disordered) materials. in MB Weissman, NE Israeloff & AS Kogan (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 5112, pp. 48-60, Noise as a Tool for Studying Materials, Santa Fe, NM, United States, 6/2/03. https://doi.org/10.1117/12.497805

@inproceedings{fd9425318c28443a88ec25716333a94b,

title = "Fluctuation microscopy: A technique for revealing atomic correlations in structurally noisy (disordered) materials",

abstract = "Fluctuation microscopy is a hybrid diffraction-imaging technique that yields information about higher-order correlations between structural units in materials. It has been shown to be well suited for detecting medium range order in atomic positions in amorphous materials. This article presents a review of fluctuation microscopy as employed in a transmission electron microscope for the study of amorphous tetrahedral semiconductors. Possible extensions of the technique to other radiations such as x-rays, and for other structurally noisy materials such as polymers and starches, are discussed.",

author = "Michael Treacy and Gibson, {J. M.}",

year = "2003",

doi = "10.1117/12.497805",

language = "English (US)",

volume = "5112",

pages = "48--60",

editor = "M.B. Weissman and N.E. Israeloff and A.S. Kogan",

booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",

note = "Noise as a Tool for Studying Materials ; Conference date: 02-06-2003 Through 04-06-2003",

}

TY - GEN

T1 - Fluctuation microscopy

T2 - Noise as a Tool for Studying Materials

AU - Treacy, Michael

AU - Gibson, J. M.

PY - 2003

Y1 - 2003

N2 - Fluctuation microscopy is a hybrid diffraction-imaging technique that yields information about higher-order correlations between structural units in materials. It has been shown to be well suited for detecting medium range order in atomic positions in amorphous materials. This article presents a review of fluctuation microscopy as employed in a transmission electron microscope for the study of amorphous tetrahedral semiconductors. Possible extensions of the technique to other radiations such as x-rays, and for other structurally noisy materials such as polymers and starches, are discussed.

AB - Fluctuation microscopy is a hybrid diffraction-imaging technique that yields information about higher-order correlations between structural units in materials. It has been shown to be well suited for detecting medium range order in atomic positions in amorphous materials. This article presents a review of fluctuation microscopy as employed in a transmission electron microscope for the study of amorphous tetrahedral semiconductors. Possible extensions of the technique to other radiations such as x-rays, and for other structurally noisy materials such as polymers and starches, are discussed.

UR - http://www.scopus.com/inward/record.url?scp=0042263306&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0042263306&partnerID=8YFLogxK

U2 - 10.1117/12.497805

DO - 10.1117/12.497805

M3 - Conference contribution

AN - SCOPUS:0042263306

VL - 5112

SP - 48

EP - 60

BT - Proceedings of SPIE - The International Society for Optical Engineering

A2 - Weissman, M.B.

A2 - Israeloff, N.E.

A2 - Kogan, A.S.

Y2 - 2 June 2003 through 4 June 2003

ER -

Fluctuation microscopy: A technique for revealing atomic correlations in structurally noisy (disordered) materials

Abstract

Other

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this