Flexible sensors based on radiation-induced diffusion of ag in chalcogenide glass

In this paper, previous work on chalcogenide-glass (ChG)-based radiation sensors is extended to include the effects of mechanical strain and temperature stress on sensors formed on a flexible polymer substrate. We demonstrate the feasibility of producing inexpensive flexible radiation sensors, which utilize radiation-induced migration of ${\rm Ag}⁺ ions in germanium selenide (${\rm Ge}-{20}{\rm Se}₈₀) films to produce a decrease in resistance of several orders of magnitude between surface electrodes. This change in resistance can be related to total ionizing dose to give an instantaneous readout of radiation exposure. The ChG films are inherently flexible and this, along with an extremely simple device fabrication process at or near room temperature, allows inexpensive sensor structures to be fabricated on lightweight pliable polymeric substrates such as polyethylene napthalate (PEN). Test samples were irradiated with ionizing radiation (UV light and $⁶⁰ Cobalt gamma rays). Irradiated samples were subjected to both tensile and compressive stress, and elevated operating temperatures. Stress and exposure to increased ambient temperature had little effect on device resistance. Analysis of the experimental data is supported by the results of COMSOL simulations that model radiation-induced lateral Ag diffusion in ChG.