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Dive into the research topics of 'Fermi level pinning and Schottky barrier characteristics on reactively ion etched 4H-SiC'. Together they form a unique fingerprint.- Sort by
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Brian Skromme, E. Luckowski, K. Moore, S. Clemens, D. Resnick, T. Gehoski, D. Ganser
Research output: Chapter in Book/Report/Conference proceeding › Chapter