Feature extraction from multiple data sources using genetic programming

John J. Szymanski, Steven P. Brumby, Paul Pope, Damian Eads, Diana Esch-Mosher, Mark Galassi, Neal R. Harvey, Hersey D W McCulloch, Simon J. Perkins, Reid Porter, James Theiler, A. Cody Young, Jeffrey J. Bloch, Nancy David

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Scopus citations


Feature extraction from imagery is an important and long-standing problem in remote sensing. In this paper, we report on work using genetic programming to perform feature extraction simultaneously from multispectral and digital elevation model (DEM) data. We use the GENetic Imagery Exploitation (Genie) software for this purpose, which produces image-processing software that inherently combines spatial and spectral processing. Genie is particularly useful in exploratory studies of imagery, such as one often does in combining data from multiple sources. The user trains the software by painting the feature of interest with a simple graphical user interface. Genie then uses genetic programming techniques to produce an image-processing pipeline. Here, we demonstrate evolution of image processing algorithms that extract a range of land cover features including towns, wildfire burnscars, and forest. We use imagery from the DOE/NNSA Multispectral Thermal Imager (MTI) spacecraft, fused with USGS 1:24000 scale DEM data.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsS.S. Shen, P.E. Lewis
Number of pages8
StatePublished - 2002
Externally publishedYes
EventAlgorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery VIII - Orlando, FL, United States
Duration: Apr 1 2002Apr 4 2002


OtherAlgorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery VIII
Country/TerritoryUnited States
CityOrlando, FL


  • Evolutionary computation
  • Feature extraction
  • Image processing
  • Multispectral analysis

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics


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