Fatigue damage prognosis of a cruciform structure under biaxial random and flight profile loading

Subhasish Mohanty, Aditi Chattopadhyay, Pedro Peralta, Dan Quech

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

The accurate estimation of fatigue life of metallic structural components in service environments is still a challenge for the aircraft designer or fleet manager. Majority of the current available fatigue life prediction models has deficiency to accurately predict damage under random or flight profile service loads. The inherent accuracy is due to the stochastic nature of crack propagation in metallic structure. In addition, currently no generic prediction model available accounting the load interaction effects due to variable loading. In the present paper we discus the use of a Generic Bayesian framework based Gaussian process approach to probabilistically predict the fatigue damage under complex random and flight profile loading.

Original languageEnglish (US)
Title of host publicationNondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2010
DOIs
StatePublished - 2010
EventNondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2010 - San Diego, CA, United States
Duration: Mar 8 2010Mar 11 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7649
ISSN (Print)0277-786X

Other

OtherNondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2010
Country/TerritoryUnited States
CitySan Diego, CA
Period3/8/103/11/10

Keywords

  • Bayesian modeling
  • Biaxial loading
  • FALSTAFF flight profile loading
  • Gaussian process
  • Multi variate fatigue modeling
  • Random loading

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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