Fabrication of carbon nanotube diode with atomic force microscopy manipulation

Liying Jiao, Xiaojun Xian, Ben Fan, Zhongyun Wu, Jin Zhang, Zhongfan Liu

Research output: Contribution to journalArticlepeer-review

6 Scopus citations


We presented a controllable yet simple approach for fabricating an air-stable single-walled carbon nanotube (SWNT) diode with the atomic force microscopy (AFM) manipulation technique. The AFM tip was utilized to create an asymmetric Schottky barrier at the two contacts of the SWNTs field effect transistors (FETs) by selectively modifying the tube-metal interaction or the contact length. Air-stable SWNTs diodes with rectification ratios of up to 104 were generated with this approach. We also demonstrated that the tube-metal interaction and the tube-metal contact length played an important role in determining the Schottky barrier at the tube-metal interface.

Original languageEnglish (US)
Pages (from-to)7544-7546
Number of pages3
JournalJournal of Physical Chemistry C
Issue number20
StatePublished - May 22 2008
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • General Energy
  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films


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