Enhancing the resolution and sensitivity of STEM by aberration correction

Nigel D. Browning, K. Sun, R. F. Klie, J. Liu, M. M. Disko, P. D. Nellist, N. Dellby, O. L. Krivanek

Research output: Contribution to journalArticlepeer-review

1 Scopus citations
Original languageEnglish (US)
Pages (from-to)18-19
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - 2002
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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