@article{4d76e3767e3648508ba5476dcd1a439b,
title = "Enhancing the resolution and sensitivity of STEM by aberration correction",
author = "Browning, {Nigel D.} and K. Sun and Klie, {R. F.} and J. Liu and Disko, {M. M.} and Nellist, {P. D.} and N. Dellby and Krivanek, {O. L.}",
year = "2002",
doi = "10.1017/s1431927602101528",
language = "English (US)",
volume = "8",
pages = "18--19",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "SUPPL. 2",
}