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Electrically conducting n-type AlGaN/GaN distributed Bragg reflectors grown by metalorganic chemical vapor deposition

  • Yuh Shiuan Liu
  • , A. F M Saniul Haq
  • , Tsung Ting Kao
  • , Karan Mehta
  • , Shyh Chiang Shen
  • , Theeradetch Detchprohm
  • , P. Douglas Yoder
  • , Russell D. Dupuis
  • , Hongen Xie
  • , Fernando Ponce

Research output: Contribution to journalArticlepeer-review

Abstract

We report an electrically conducting 40-pair silicon doped Al0.12Ga0.88N/GaN distributed Bragg reflector (DBR) grown by metalorganic chemical vapor deposition on a silicon doped n-type GaN template. Due to the relatively small lattice mismatch between AlGaN and GaN, strain managing layers are not required for crack-free n-DBR growth. The DBR demonstrates a peak reflectivity of 91.6% at 368 nm with stopband of 11 nm. In addition, the 40-pair n-DBR shows the vertical resistance of 5.5 Ω, which corresponds to bulk resistivity of 0.52 Ω cm, near the maximum measured current of 100 mA.

Original languageEnglish (US)
Pages (from-to)81-84
Number of pages4
JournalJournal of Crystal Growth
Volume443
DOIs
StatePublished - Jun 1 2016

Keywords

  • A2. Metalorganic chemical vapor deposition
  • B1. Nitride
  • B2. Semiconductor III-V materials
  • B3. Laser diodes

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Chemistry

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