Difficult Measurements of Materials Systems at Cryogenic Temperatures: Cryo-EELS and Cryo-4D-STEM

Peter Ercius; Sandhya Susarla; Mit H. Naik; Yujun Xie; Jingyang Wang; Archana Raja; Colin Ophus; Haimei Zheng

doi:10.1093/mam/ozae044.1071

Difficult Measurements of Materials Systems at Cryogenic Temperatures: Cryo-EELS and Cryo-4D-STEM

Peter Ercius
, Sandhya Susarla
, Mit H. Naik
, Yujun Xie
, Jingyang Wang
, Archana Raja
, Colin Ophus
, Haimei Zheng

Engineering, Ira A. Fulton Schools of (IAFSE)

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	2164
Number of pages	1
Journal	Microscopy and Microanalysis
Volume	30
Issue number	2024
DOIs	https://doi.org/10.1093/mam/ozae044.1071
State	Published - Jul 24 2024
Event	82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: Jul 28 2024 → Aug 1 2024

ASJC Scopus subject areas

Instrumentation

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10.1093/mam/ozae044.1071

Cite this

@article{a492da2e550a4f9180e47cb9acbf967e,

title = "Difficult Measurements of Materials Systems at Cryogenic Temperatures: Cryo-EELS and Cryo-4D-STEM",

author = "Peter Ercius and Sandhya Susarla and Naik, \{Mit H.\} and Yujun Xie and Jingyang Wang and Archana Raja and Colin Ophus and Haimei Zheng",

year = "2024",

month = jul,

day = "24",

doi = "10.1093/mam/ozae044.1071",

language = "English (US)",

volume = "30",

pages = "2164",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "2024",

note = "82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 ; Conference date: 28-07-2024 Through 01-08-2024",

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TY - JOUR

T1 - Difficult Measurements of Materials Systems at Cryogenic Temperatures

T2 - 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024

AU - Ercius, Peter

AU - Susarla, Sandhya

AU - Naik, Mit H.

AU - Xie, Yujun

AU - Wang, Jingyang

AU - Raja, Archana

AU - Ophus, Colin

AU - Zheng, Haimei

PY - 2024/7/24

Y1 - 2024/7/24

UR - https://www.scopus.com/pages/publications/85215677042

UR - https://www.scopus.com/pages/publications/85215677042#tab=citedBy

U2 - 10.1093/mam/ozae044.1071

DO - 10.1093/mam/ozae044.1071

M3 - Conference article

AN - SCOPUS:85215677042

SN - 1431-9276

VL - 30

SP - 2164

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 2024

Y2 - 28 July 2024 through 1 August 2024

ER -

Difficult Measurements of Materials Systems at Cryogenic Temperatures: Cryo-EELS and Cryo-4D-STEM

ASJC Scopus subject areas

Access to Document

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