DIET in the bulk: Evidence for hot electron cleavage of Si-H bonds in SiO₂ films

Chemical Compounds

• Hot Electron 96%
• Leakage Current 58%
• Cleavage 46%
• Hopping Conductivity 39%
• Resonance 35%
• Morse Potential 35%
• Liquid Film 32%
• Dangling Bond 29%
• Electron Capture 24%
• Conduction Band 24%
• Electronic Transition 23%
• Interstitial 23%
• Hydrogen 22%
• Excited State 17%
• Dissociation 16%
• Amorphous Material 15%
• Gas 11%
• Energy 10%
• Amount 9%
• Reaction Yield 9%
• Surface 7%

Physics & Astronomy

• hot electrons 69%
• cleavage 69%
• hydrogen 41%
• leakage 36%
• Morse potential 29%
• electron states 24%
• electron capture 23%
• conduction bands 19%
• interstitials 19%
• dissociation 18%
• vapor phases 17%
• costs 16%
• traps 16%
• damage 15%
• conductivity 14%
• thresholds 13%
• cross sections 13%
• defects 12%
• electronics 11%
• excitation 10%
• electrons 9%
• energy 6%

Engineering & Materials Science

• Hot electrons 100%
• Hydrogen 53%
• Leakage currents 36%
• Dangling bonds 30%
• Morse potential 29%
• Conduction bands 28%
• Excited states 27%
• Electron energy levels 19%
• Substrates 11%
• Defects 11%
• Uncertainty 10%
• Gases 9%
• Costs 6%