Defect filter for alternate RF test

Haralampos G. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Scopus citations


Alternate RF testing is a very promising candidate for replacing the costly standard specification-based approach. The defect filter in the alternate test flow is a crucial preparatory step for the overall success of alternate test. In this paper, we present a novel nonlinear defect filter based on an estimate of the joint probability density function of the alternate measurements. The construction of the filter does not require a defect dictionary and can accommodate any underlying density without needing any prior knowledge regarding its parametric form.

Original languageEnglish (US)
Title of host publication2010 15th IEEE European Test Symposium, ETS'10
Number of pages6
StatePublished - 2010
Event2010 15th IEEE European Test Symposium, ETS'10 - Prague, Czech Republic
Duration: May 24 2010May 28 2010

Publication series

Name2010 15th IEEE European Test Symposium, ETS'10


Other2010 15th IEEE European Test Symposium, ETS'10
Country/TerritoryCzech Republic

ASJC Scopus subject areas

  • Electrical and Electronic Engineering


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