TY - JOUR
T1 - Deep Anomaly Analytics
T2 - Advancing the Frontier of Anomaly Detection
AU - Xia, Feng
AU - Akoglu, Leman
AU - Aggarwal, Charu
AU - Liu, Huan
N1 - Publisher Copyright:
© 2001-2011 IEEE.
PY - 2023/3/1
Y1 - 2023/3/1
N2 - Deep anomaly analytics is a rapidly evolving field that leverages the power of deep learning to identify anomalies in various datasets. The use of deep anomaly analytics has increased significantly in recent years due to the growing need to detect anomalies in complex data that traditional methods struggle to handle. Deep anomaly analytics has the potential to transform various industries, including, e.g., healthcare, finance, and cybersecurity, by providing valuable insights and helping to diagnose diseases, prevent fraud, and detect cyber threats. However, there are also many challenges associated with deep anomaly analytics. This editorial provides an overview of the field of deep anomaly analytics, and highlights a few key challenges facing this field, i.e., time series anomaly detection, graph anomaly detection, efficiency (of models), and solving real-world problems. Additionally, it serves as an introduction to this special issue that delves further into these topics.
AB - Deep anomaly analytics is a rapidly evolving field that leverages the power of deep learning to identify anomalies in various datasets. The use of deep anomaly analytics has increased significantly in recent years due to the growing need to detect anomalies in complex data that traditional methods struggle to handle. Deep anomaly analytics has the potential to transform various industries, including, e.g., healthcare, finance, and cybersecurity, by providing valuable insights and helping to diagnose diseases, prevent fraud, and detect cyber threats. However, there are also many challenges associated with deep anomaly analytics. This editorial provides an overview of the field of deep anomaly analytics, and highlights a few key challenges facing this field, i.e., time series anomaly detection, graph anomaly detection, efficiency (of models), and solving real-world problems. Additionally, it serves as an introduction to this special issue that delves further into these topics.
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U2 - 10.1109/MIS.2023.3255590
DO - 10.1109/MIS.2023.3255590
M3 - Review article
AN - SCOPUS:85158030464
SN - 1541-1672
VL - 38
SP - 32
EP - 35
JO - IEEE Intelligent Systems
JF - IEEE Intelligent Systems
IS - 2
ER -