Current status and future directions for in situ transmission electron microscopy

Mitra L. Taheri, Eric A. Stach, Ilke Arslan, Peter Crozier, Bernd C. Kabius, Thomas LaGrange, Andrew M. Minor, Seiji Takeda, Mihaela Tanase, Jakob B. Wagner, Renu Sharma

Research output: Contribution to journalReview articlepeer-review

148 Scopus citations


This review article discusses the current and future possibilities for the application of in situ transmission electron microscopy to reveal synthesis pathways and functional mechanisms in complex and nanoscale materials. The findings of a group of scientists, representing academia, government labs and private sector entities (predominantly commercial vendors) during a workshop, held at the Center for Nanoscale Science and Technology- National Institute of Science and Technology (CNST-NIST), are discussed. We provide a comprehensive review of the scientific needs and future instrument and technique developments required to meet them.

Original languageEnglish (US)
Pages (from-to)86-95
Number of pages10
StatePublished - Nov 1 2016


  • DTEM
  • Direct electron detectors
  • ETEM
  • Gas/liquid-solid interactions
  • Heating holder
  • In situ TEM
  • Indentation holder
  • Liquid/gas cell holder
  • Phase transformation
  • Structure property relationship

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation


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