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Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering

  • Andrew M. Levine
  • , Guanhong Bu
  • , Sankarsan Biswas
  • , Esther H.R. Tsai
  • , Adam B. Braunschweig
  • , Brent L. Nannenga

Research output: Contribution to journal › Article › peer-review

32   Link opens in a new tab Scopus citations

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Material Science