Abstract
This article reports the temperature-dependent characterization and analysis of quasi-ballistic transport in fully depleted silicon-on-insulator (FD-SOI) metal-oxide-semiconductor field-effect-transistors (MOSFETs) from a 22-nm commercial CMOS technology. Measurements of current-voltage (I-V) characteristics for temperatures ranging from 10 up to 300 K are presented in this article. Key electrical parameters are extracted as a function of temperature, including threshold voltage, subthreshold swing, ON-state current, series resistance, mobility, mean free path, and ballistic ratio. An experimentally validated virtual source modeling approach that incorporates back-gate biasing is presented in this article for temperatures down to 10 K. A comparison with bulk devices reveals less reduction in ballisticity at low temperatures and is attributed to a smaller contribution from ionized impurity scattering due to lower doping in the fully depleted (FD) channel.
Original language | English (US) |
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Pages (from-to) | 1306-1312 |
Number of pages | 7 |
Journal | IEEE Transactions on Electron Devices |
Volume | 69 |
Issue number | 3 |
DOIs | |
State | Published - Mar 1 2022 |
Keywords
- Ballistic transport
- Cmos
- Compact model
- Cryogenic
- Mean free path
- Metal oxide semiconductor field-effect-transistor (mosfet)
- Mobility
- Nanoscale.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering