Abstract
A system for computer control of a TEM/STEM is described and advantages of computer control for imaging using X-ray and energy loss signals discussed. Results showing line profiles and images using analytical signals are presented.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 341-350 |
| Number of pages | 10 |
| Journal | Ultramicroscopy |
| Volume | 8 |
| Issue number | 3 |
| DOIs | |
| State | Published - 1982 |
| Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation
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