Compositional Analysis of SiOC(H) Powders: A Comparison of X-ray Photoelectron Spectroscopy (XPS) and Combustion Analysis

Gerson J. Leonel; Xin Guo; Gurpreet Singh; Alexandra Navrotsky

doi:10.3390/ceramics6010006

Compositional Analysis of SiOC(H) Powders: A Comparison of X-ray Photoelectron Spectroscopy (XPS) and Combustion Analysis

Gerson J. Leonel, Xin Guo, Gurpreet Singh, Alexandra Navrotsky

Molecular Sciences, School of (SMS)

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

Accurate chemical analysis of small samples of fine powders in the Si–O–C–H system is challenging. We present a comparison of analysis by X-ray photoelectron spectroscopy (XPS) and combustion analysis, validating XPS as an accurate and simple methodology for Si, C, and O analysis to give bulk and not just surface compositions. The XPS analyses are supported by showing consistency in thermochemical calculations of heats of formation based on high temperature oxide melt solution calorimetry. However, because XPS is not suitable for quantitation of hydrogen, it must be combined with other techniques for samples with substantial H content.

Original language	English (US)
Pages (from-to)	74-85
Number of pages	12
Journal	Ceramics
Volume	6
Issue number	1
DOIs	https://doi.org/10.3390/ceramics6010006
State	Published - Mar 2023

Keywords

energetics
industrial precusors
nanodomain structure
polymer-derived ceramics
polysiloxanes
silicon oxycarbide

ASJC Scopus subject areas

Ceramics and Composites
Materials Science (miscellaneous)

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10.3390/ceramics6010006

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abstract = "Accurate chemical analysis of small samples of fine powders in the Si–O–C–H system is challenging. We present a comparison of analysis by X-ray photoelectron spectroscopy (XPS) and combustion analysis, validating XPS as an accurate and simple methodology for Si, C, and O analysis to give bulk and not just surface compositions. The XPS analyses are supported by showing consistency in thermochemical calculations of heats of formation based on high temperature oxide melt solution calorimetry. However, because XPS is not suitable for quantitation of hydrogen, it must be combined with other techniques for samples with substantial H content.",

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AU - Leonel, Gerson J.

AU - Guo, Xin

AU - Singh, Gurpreet

AU - Navrotsky, Alexandra

PY - 2023/3

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N2 - Accurate chemical analysis of small samples of fine powders in the Si–O–C–H system is challenging. We present a comparison of analysis by X-ray photoelectron spectroscopy (XPS) and combustion analysis, validating XPS as an accurate and simple methodology for Si, C, and O analysis to give bulk and not just surface compositions. The XPS analyses are supported by showing consistency in thermochemical calculations of heats of formation based on high temperature oxide melt solution calorimetry. However, because XPS is not suitable for quantitation of hydrogen, it must be combined with other techniques for samples with substantial H content.

AB - Accurate chemical analysis of small samples of fine powders in the Si–O–C–H system is challenging. We present a comparison of analysis by X-ray photoelectron spectroscopy (XPS) and combustion analysis, validating XPS as an accurate and simple methodology for Si, C, and O analysis to give bulk and not just surface compositions. The XPS analyses are supported by showing consistency in thermochemical calculations of heats of formation based on high temperature oxide melt solution calorimetry. However, because XPS is not suitable for quantitation of hydrogen, it must be combined with other techniques for samples with substantial H content.

KW - energetics

KW - industrial precusors

KW - nanodomain structure

KW - polymer-derived ceramics

KW - polysiloxanes

KW - silicon oxycarbide

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Compositional Analysis of SiOC(H) Powders: A Comparison of X-ray Photoelectron Spectroscopy (XPS) and Combustion Analysis

Abstract

Keywords

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