Compact modeling and simulation of accelerated circuit aging

Keyphrases

• Accelerated Aging 100%
• Compact Modeling 100%
• Circuit Aging 100%
• Degradation Rate 66%
• Circuit Simulation 33%
• Compact Model 33%
• Aging Effect 33%
• Circuit Topology 33%
• Iterative Simulation 33%
• Design Condition 33%
• 14nm Technology 33%
• Reliability Physics 33%
• Benchmark Circuits 33%
• Operation Effect 33%

Engineering

• Degradation Rate 100%
• Conventional Method 50%
• Illustrates 50%
• Circuit Simulation 50%
• Electric Network Topology 50%
• Aging Effect 50%
• Design Condition 50%