Commercial spectrometer modifications for energy filtering of electron diffraction patterns and images

R. Holmestad; O. L. Krivanek; R. Høier; K. Marthinsen; John Spence

doi:10.1016/0304-3991(93)90060-B

Commercial spectrometer modifications for energy filtering of electron diffraction patterns and images

R. Holmestad, O. L. Krivanek, R. Høier, K. Marthinsen, John Spence

Physics

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

A commercial parallel electron energy loss spectrometer (PEELS) system has been modified to allow it to record, line by line, two-dimensional energy-filtered electron diffraction patterns or images. The results given for convergent beam electron diffraction patterns in silicon show that the performance of the system is intermediate between that of an imaging energy filter (such as an omega filter) and a serial scanned readout Grigson system.

Original language	English (US)
Pages (from-to)	454-458
Number of pages	5
Journal	Ultramicroscopy
Volume	52
Issue number	3-4
DOIs	https://doi.org/10.1016/0304-3991(93)90060-B
State	Published - Dec 1993

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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10.1016/0304-3991(93)90060-B

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@article{2259eea3142a4877973ea9f5ed5caf88,

title = "Commercial spectrometer modifications for energy filtering of electron diffraction patterns and images",

abstract = "A commercial parallel electron energy loss spectrometer (PEELS) system has been modified to allow it to record, line by line, two-dimensional energy-filtered electron diffraction patterns or images. The results given for convergent beam electron diffraction patterns in silicon show that the performance of the system is intermediate between that of an imaging energy filter (such as an omega filter) and a serial scanned readout Grigson system.",

author = "R. Holmestad and Krivanek, {O. L.} and R. H{\o}ier and K. Marthinsen and John Spence",

note = "Funding Information: Mike Leber at Gatan and Max Otten at Philips are gratefully acknowledged for their help with the remote control software. Randi Holmestad is supported by the Royal Norwegian Council for Scientific and Industrial Research. J.C.H.S. is supported by NSF award DMR-9015867.",

year = "1993",

month = dec,

doi = "10.1016/0304-3991(93)90060-B",

language = "English (US)",

volume = "52",

pages = "454--458",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

number = "3-4",

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TY - JOUR

T1 - Commercial spectrometer modifications for energy filtering of electron diffraction patterns and images

AU - Holmestad, R.

AU - Krivanek, O. L.

AU - Høier, R.

AU - Marthinsen, K.

AU - Spence, John

N1 - Funding Information: Mike Leber at Gatan and Max Otten at Philips are gratefully acknowledged for their help with the remote control software. Randi Holmestad is supported by the Royal Norwegian Council for Scientific and Industrial Research. J.C.H.S. is supported by NSF award DMR-9015867.

PY - 1993/12

Y1 - 1993/12

N2 - A commercial parallel electron energy loss spectrometer (PEELS) system has been modified to allow it to record, line by line, two-dimensional energy-filtered electron diffraction patterns or images. The results given for convergent beam electron diffraction patterns in silicon show that the performance of the system is intermediate between that of an imaging energy filter (such as an omega filter) and a serial scanned readout Grigson system.

AB - A commercial parallel electron energy loss spectrometer (PEELS) system has been modified to allow it to record, line by line, two-dimensional energy-filtered electron diffraction patterns or images. The results given for convergent beam electron diffraction patterns in silicon show that the performance of the system is intermediate between that of an imaging energy filter (such as an omega filter) and a serial scanned readout Grigson system.

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U2 - 10.1016/0304-3991(93)90060-B

DO - 10.1016/0304-3991(93)90060-B

M3 - Article

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SN - 0304-3991

VL - 52

SP - 454

EP - 458

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 3-4

ER -

Commercial spectrometer modifications for energy filtering of electron diffraction patterns and images

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