Abstract
The detection of coincidental signals can enhance the amount of information available in desorption time-of-flight mass spectrometry (TOF-MS) by identifying physical, chemical and/or spatial correlations between secondary ions. Detection of coincidental emissions requires that the target surface be bombarded with individual primary ions (keV or MeV), each resolved in time and space. This paper will discuss the application of coincidence counting to TOF-MS to: extract the secondary ion mass spectrum and secondary ion yields from an organic target produced by a single primary ion type when multiple primary ions simultaneously impact the sample; examine the metastable dissociation pathways and decay fractions of organic secondary ions using an ion-neutral correlation method; and study the chemical microhomogeneity (on the sub-μm scale) of a surface composed of two chemically distinct species.
Original language | English (US) |
---|---|
Pages (from-to) | 883-890 |
Number of pages | 8 |
Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
Volume | 193 |
Issue number | 1-4 |
DOIs | |
State | Published - Jun 2002 |
Externally published | Yes |
Keywords
- Desorption
- Metastability
- Polyatomic primary ions
- Secondary ion mass spectrometry
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Instrumentation