Circuit design for reliability

Ricardo Reis, Gilson Wirth, Yu Cao

Research output: Book/ReportBook

26 Scopus citations


This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

Original languageEnglish (US)
PublisherSpringer New York
Number of pages272
ISBN (Electronic)9781461440789
ISBN (Print)9781461440772
StatePublished - Jan 1 2015

ASJC Scopus subject areas

  • General Engineering


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