Characterization of Zinc Telluride Grown on Silicon by MBE

J. J. Kim; David Smith; Y. Chen; G. N. Brill

doi:10.1017/S1431927612011099

Characterization of Zinc Telluride Grown on Silicon by MBE

J. J. Kim, David Smith, Y. Chen, G. N. Brill

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	1848-1849
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
Issue number	S2
DOIs	https://doi.org/10.1017/S1431927612011099
State	Published - Jul 2012

ASJC Scopus subject areas

Instrumentation

Access to Document

10.1017/S1431927612011099

Cite this

@article{8dca7ce3a29b4f449056bd4f96db0c73,

title = "Characterization of Zinc Telluride Grown on Silicon by MBE",

author = "Kim, {J. J.} and David Smith and Y. Chen and Brill, {G. N.}",

year = "2012",

month = jul,

doi = "10.1017/S1431927612011099",

language = "English (US)",

volume = "18",

pages = "1848--1849",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "S2",

}

TY - JOUR

T1 - Characterization of Zinc Telluride Grown on Silicon by MBE

AU - Kim, J. J.

AU - Smith, David

AU - Chen, Y.

AU - Brill, G. N.

PY - 2012/7

Y1 - 2012/7

UR - http://www.scopus.com/inward/record.url?scp=85008544144&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85008544144&partnerID=8YFLogxK

U2 - 10.1017/S1431927612011099

DO - 10.1017/S1431927612011099

M3 - Article

AN - SCOPUS:85008544144

SN - 1431-9276

VL - 18

SP - 1848

EP - 1849

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S2

ER -

Characterization of Zinc Telluride Grown on Silicon by MBE

ASJC Scopus subject areas

Access to Document

Other files and links

Cite this