Characterization of Al/Si junctions on Si(100) wafers with chemical vapor deposition-based sulfur passivation

  • Hai Feng Zhang
  • , Arunodoy Saha
  • , Wen Cheng Sun
  • , Meng Tao

Research output: Contribution to journal › Article › peer-review

13 Scopus citations

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Keyphrases

Engineering

Chemistry

Material Science