Channelling-enhanced microanalysis using [111] and [001] zone-axis beam incidence for L12-type Ni3(Al, Ta)

Z. Horita; Martha McCartney; H. Kuninaka

doi:10.1080/01418619708210288

Channelling-enhanced microanalysis using [111] and [001] zone-axis beam incidence for L1₂-type Ni₃(Al, Ta)

Z. Horita, Martha McCartney, H. Kuninaka

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

Site occupancy has been determined using the channelling-enhanced microanalysis for a Ni₃(Al, Ta) intermetallic compound with the L1₂-type crystal structure. It is shown that there is a large scattering of data points for [001] beam incidence compared with [111] beam incidence. The reasons for this difference are examined by simulating channelling electron distribution on the A1 and Ni columns. It is concluded that the large scattering for the [001] beam incidence is due to the indistinguishable difference between channelling electron intensities on the A1 and Ni columns.

Original language	English (US)
Pages (from-to)	153-167
Number of pages	15
Journal	Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Volume	75
Issue number	1
DOIs	https://doi.org/10.1080/01418619708210288
State	Published - Jan 1997

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Materials Science(all)
Condensed Matter Physics
Physics and Astronomy (miscellaneous)
Metals and Alloys

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10.1080/01418619708210288

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title = "Channelling-enhanced microanalysis using [111] and [001] zone-axis beam incidence for L12-type Ni3(Al, Ta)",

abstract = "Site occupancy has been determined using the channelling-enhanced microanalysis for a Ni3(Al, Ta) intermetallic compound with the L12-type crystal structure. It is shown that there is a large scattering of data points for [001] beam incidence compared with [111] beam incidence. The reasons for this difference are examined by simulating channelling electron distribution on the A1 and Ni columns. It is concluded that the large scattering for the [001] beam incidence is due to the indistinguishable difference between channelling electron intensities on the A1 and Ni columns.",

author = "Z. Horita and Martha McCartney and H. Kuninaka",

note = "Funding Information: ACKNOWLEDGEMENTS This work was supported by Grant-in Aid for Scientific Research from the Ministry of Education, Science, Culture and Sports of Japan, the Monbusho International Scientific Research Program (06044169), and the National Science",

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AU - Horita, Z.

AU - McCartney, Martha

AU - Kuninaka, H.

N1 - Funding Information: ACKNOWLEDGEMENTS This work was supported by Grant-in Aid for Scientific Research from the Ministry of Education, Science, Culture and Sports of Japan, the Monbusho International Scientific Research Program (06044169), and the National Science

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N2 - Site occupancy has been determined using the channelling-enhanced microanalysis for a Ni3(Al, Ta) intermetallic compound with the L12-type crystal structure. It is shown that there is a large scattering of data points for [001] beam incidence compared with [111] beam incidence. The reasons for this difference are examined by simulating channelling electron distribution on the A1 and Ni columns. It is concluded that the large scattering for the [001] beam incidence is due to the indistinguishable difference between channelling electron intensities on the A1 and Ni columns.

AB - Site occupancy has been determined using the channelling-enhanced microanalysis for a Ni3(Al, Ta) intermetallic compound with the L12-type crystal structure. It is shown that there is a large scattering of data points for [001] beam incidence compared with [111] beam incidence. The reasons for this difference are examined by simulating channelling electron distribution on the A1 and Ni columns. It is concluded that the large scattering for the [001] beam incidence is due to the indistinguishable difference between channelling electron intensities on the A1 and Ni columns.

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Channelling-enhanced microanalysis using [111] and [001] zone-axis beam incidence for L1₂-type Ni₃(Al, Ta)

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