CBED study of low-temperature InP grown by gas source MBE

R. Rajesh, M. J. Kim, J. S. Bow, Ray Carpenter, G. N. Maracas

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Scopus citations

    Abstract

    Attempts had been made to understand the relationships between the structural and electrical properties of the MBE grown low temperature (LT) InP in the previous work. The present paper further studies the observation of metallic indium islands solely in the annealed LT layers in order to better understand the exact reasons for their formation.

    Original languageEnglish (US)
    Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
    PublisherPubl by San Francisco Press Inc
    Pages810-811
    Number of pages2
    StatePublished - 1993
    EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
    Duration: Aug 1 1993Aug 6 1993

    Other

    OtherProceedings of the 51st Annual Meeting Microscopy Society of America
    CityCincinnati, OH, USA
    Period8/1/938/6/93

    ASJC Scopus subject areas

    • General Engineering

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