Calculations of limited coherence for high resolution electron microscopy

L. Y. Chang; R. R. Meyer; A. I. Kirkland

Calculations of limited coherence for high resolution electron microscopy

L. Y. Chang, R. R. Meyer, A. I. Kirkland

Research output: Contribution to journal › Conference article › peer-review

Abstract

Improvements in instrumentation through the use of monochromators and field emission electron sources suggest that the ways in which the limited coherence effects are calculated must be re-examined. In this paper the effects of these approximations on the accuracy of the resultant image intensity are investigated as a function of both defocus and beam divergence.

Original language	English (US)
Pages (from-to)	345-348
Number of pages	4
Journal	Institute of Physics Conference Series
Volume	179
State	Published - Oct 19 2004
Externally published	Yes
Event	Electron Microscopy and Analysis 2003 - Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference - Oxford, United Kingdom Duration: Sep 3 2003 → Sep 5 2003

ASJC Scopus subject areas

Physics and Astronomy(all)

Cite this

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title = "Calculations of limited coherence for high resolution electron microscopy",

abstract = "Improvements in instrumentation through the use of monochromators and field emission electron sources suggest that the ways in which the limited coherence effects are calculated must be re-examined. In this paper the effects of these approximations on the accuracy of the resultant image intensity are investigated as a function of both defocus and beam divergence.",

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year = "2004",

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AU - Chang, L. Y.

AU - Meyer, R. R.

AU - Kirkland, A. I.

PY - 2004/10/19

Y1 - 2004/10/19

N2 - Improvements in instrumentation through the use of monochromators and field emission electron sources suggest that the ways in which the limited coherence effects are calculated must be re-examined. In this paper the effects of these approximations on the accuracy of the resultant image intensity are investigated as a function of both defocus and beam divergence.

AB - Improvements in instrumentation through the use of monochromators and field emission electron sources suggest that the ways in which the limited coherence effects are calculated must be re-examined. In this paper the effects of these approximations on the accuracy of the resultant image intensity are investigated as a function of both defocus and beam divergence.

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M3 - Conference article

AN - SCOPUS:5044235124

SN - 0951-3248

VL - 179

SP - 345

EP - 348

JO - Institute of Physics Conference Series

JF - Institute of Physics Conference Series

T2 - Electron Microscopy and Analysis 2003 - Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference

Y2 - 3 September 2003 through 5 September 2003

ER -

Calculations of limited coherence for high resolution electron microscopy

Abstract

ASJC Scopus subject areas

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