Atomic species identification in STM using an imaging atom-probe technique

Uwe Weierstall; John Spence

doi:10.1016/S0039-6028(98)80030-7

Atomic species identification in STM using an imaging atom-probe technique

Uwe Weierstall, John Spence

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

In this paper we report new experimental results with the scanning tunneling atom probe (STAP), a new instrument that combines the functions of a scanning tunneling microscope (STM) and a time-of-flight atom probe. In STM-mode, clusters of atoms are transferred from regions of interest to the tip, from which they are ejected into a time-of-flight spectrometer for species identification. Improvements to the instrument and experimental results with in situ grown germanium layers on Si(111)-(7×7) are shown. Problems with the atom transfer and possible remedies are discussed.

Original language	English (US)
Pages (from-to)	267-279
Number of pages	13
Journal	Surface Science
Volume	398
Issue number	1-2
DOIs	https://doi.org/10.1016/S0039-6028(98)80030-7
State	Published - 1998

Keywords

Adatoms
Field evaporation
Germanium
Low index single crystal surfaces
Scanning tunneling microscopy
Semiconductor-semiconductor heterostructures
Silicon
Silver

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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10.1016/S0039-6028(98)80030-7

Cite this

@article{c0af87292c9c461293146e104cda80de,

title = "Atomic species identification in STM using an imaging atom-probe technique",

abstract = "In this paper we report new experimental results with the scanning tunneling atom probe (STAP), a new instrument that combines the functions of a scanning tunneling microscope (STM) and a time-of-flight atom probe. In STM-mode, clusters of atoms are transferred from regions of interest to the tip, from which they are ejected into a time-of-flight spectrometer for species identification. Improvements to the instrument and experimental results with in situ grown germanium layers on Si(111)-(7×7) are shown. Problems with the atom transfer and possible remedies are discussed.",

keywords = "Adatoms, Field evaporation, Germanium, Low index single crystal surfaces, Scanning tunneling microscopy, Semiconductor-semiconductor heterostructures, Silicon, Silver",

author = "Uwe Weierstall and John Spence",

note = "Funding Information: This work was supportedb y NSF award numbers DMR-9112550a nd DMR-9526100.W e are grateful to Professor G. Smith and D. Seidman for helpful discussions.",

year = "1998",

doi = "10.1016/S0039-6028(98)80030-7",

language = "English (US)",

volume = "398",

pages = "267--279",

journal = "Surface Science",

issn = "0039-6028",

publisher = "Elsevier",

number = "1-2",

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TY - JOUR

T1 - Atomic species identification in STM using an imaging atom-probe technique

AU - Weierstall, Uwe

AU - Spence, John

N1 - Funding Information: This work was supportedb y NSF award numbers DMR-9112550a nd DMR-9526100.W e are grateful to Professor G. Smith and D. Seidman for helpful discussions.

PY - 1998

Y1 - 1998

N2 - In this paper we report new experimental results with the scanning tunneling atom probe (STAP), a new instrument that combines the functions of a scanning tunneling microscope (STM) and a time-of-flight atom probe. In STM-mode, clusters of atoms are transferred from regions of interest to the tip, from which they are ejected into a time-of-flight spectrometer for species identification. Improvements to the instrument and experimental results with in situ grown germanium layers on Si(111)-(7×7) are shown. Problems with the atom transfer and possible remedies are discussed.

AB - In this paper we report new experimental results with the scanning tunneling atom probe (STAP), a new instrument that combines the functions of a scanning tunneling microscope (STM) and a time-of-flight atom probe. In STM-mode, clusters of atoms are transferred from regions of interest to the tip, from which they are ejected into a time-of-flight spectrometer for species identification. Improvements to the instrument and experimental results with in situ grown germanium layers on Si(111)-(7×7) are shown. Problems with the atom transfer and possible remedies are discussed.

KW - Adatoms

KW - Field evaporation

KW - Germanium

KW - Low index single crystal surfaces

KW - Scanning tunneling microscopy

KW - Semiconductor-semiconductor heterostructures

KW - Silicon

KW - Silver

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U2 - 10.1016/S0039-6028(98)80030-7

DO - 10.1016/S0039-6028(98)80030-7

M3 - Article

AN - SCOPUS:0032003905

SN - 0039-6028

VL - 398

SP - 267

EP - 279

JO - Surface Science

JF - Surface Science

IS - 1-2

ER -

Atomic species identification in STM using an imaging atom-probe technique

Abstract

Keywords

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