Atomic species identification in STM using an imaging atom-probe technique

Uwe Weierstall, John Spence

Research output: Contribution to journalArticlepeer-review

11 Scopus citations


In this paper we report new experimental results with the scanning tunneling atom probe (STAP), a new instrument that combines the functions of a scanning tunneling microscope (STM) and a time-of-flight atom probe. In STM-mode, clusters of atoms are transferred from regions of interest to the tip, from which they are ejected into a time-of-flight spectrometer for species identification. Improvements to the instrument and experimental results with in situ grown germanium layers on Si(111)-(7×7) are shown. Problems with the atom transfer and possible remedies are discussed.

Original languageEnglish (US)
Pages (from-to)267-279
Number of pages13
JournalSurface Science
Issue number1-2
StatePublished - 1998


  • Adatoms
  • Field evaporation
  • Germanium
  • Low index single crystal surfaces
  • Scanning tunneling microscopy
  • Semiconductor-semiconductor heterostructures
  • Silicon
  • Silver

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry


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