Atomic-scale characterization of (mostly zincblende) compound semiconductor heterostructures

Keyphrases

• Semiconductor Heterostructures 100%
• Compound Semiconductors 100%
• Zinc Blende 100%
• Atomic-scale Characterization 100%
• Lattice Mismatch 50%
• Atomic Scale 50%
• Aberration-corrected Scanning Transmission Electron Microscopy 50%
• Molecular Beam Epitaxy 50%
• Defect Type 50%
• Defect Distribution 50%
• Growth Defects 50%
• Compound Material 50%
• Defect Analysis 50%
• Residual Strain 50%
• Interfacial Strain 50%
• Image Filtering 50%

Material Science

• Heterojunction 100%
• Compound Semiconductor 100%
• Lattice Mismatch 50%
• Molecular Beam Epitaxy 50%
• Electron Microscopy 50%