Applications of aberration-corrected tem and stem in complex oxides and nanostructured materials

S. Lazar; L. Y. Chang; L. Gunawan; Y. Shao; G. A. Botton

doi:10.1017/S1431927609098663

Applications of aberration-corrected tem and stem in complex oxides and nanostructured materials

S. Lazar, L. Y. Chang, L. Gunawan, Y. Shao, G. A. Botton

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	154-155
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	15
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927609098663
State	Published - Jul 2009
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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10.1017/S1431927609098663

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title = "Applications of aberration-corrected tem and stem in complex oxides and nanostructured materials",

author = "S. Lazar and Chang, {L. Y.} and L. Gunawan and Y. Shao and Botton, {G. A.}",

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AU - Lazar, S.

AU - Chang, L. Y.

AU - Gunawan, L.

AU - Shao, Y.

AU - Botton, G. A.

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JO - Microscopy and Microanalysis

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Applications of aberration-corrected tem and stem in complex oxides and nanostructured materials

ASJC Scopus subject areas

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