Applications of aberration-corrected tem and stem in complex oxides and nanostructured materials

S. Lazar, L. Y. Chang, L. Gunawan, Y. Shao, G. A. Botton

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)154-155
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Jul 2009
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

Cite this