Abstract
The momentum transfer in electron-energy-loss spectra (EELS) recorded in an electron microscope can be controlled in a manner akin to polarization-dependent soft-x-ray absorption spectroscopy, however with much greater spatial resolution. Here we report orientation-dependent EELS from fine-grained (formula presented) for both B K and Mg (formula presented) edges. Calculations based on an excited final state are used to suggest an anisotropic exciton for the peak at 55 eV at the Mg (formula presented) edge.
Original language | English (US) |
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Pages (from-to) | 1-4 |
Number of pages | 4 |
Journal | Physical Review B - Condensed Matter and Materials Physics |
Volume | 66 |
Issue number | 17 |
DOIs | |
State | Published - Jan 1 2002 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics