Keyphrases
Integrated Circuits
100%
Built-in-self-test (BiST)
100%
Electrical Stimulus
100%
Microelectromechanical Systems (MEMS) Accelerometer
100%
Circuitry
57%
Physical Stimuli
28%
Integrated Circuit Design
14%
Signal Readout
14%
CMOS Technology
14%
Mixed-signal
14%
Analog Signal
14%
Computationally Expensive
14%
Manufacturing Cost
14%
Low Computational Complexity
14%
Readout Integrated Circuit
14%
Fast Fourier Transform
14%
Self-testing
14%
Phase Response
14%
Processor Core
14%
Micro-electro-mechanical Systems
14%
Test Operation
14%
Analog Front-end
14%
Hermetically Sealed
14%
Electrical Excitation
14%
Host Processor
14%
Multivariate Linear Regression
14%
Three-axis
14%
Circuit Area
14%
Readout Signal
14%
Amplitude Response
14%
Acceleration Sensor
14%
Mechanical Sensitivity
14%
Engineering
Capacitive
100%
Microelectromechanical System
100%
Built-in Self Test
100%
Integrated Circuit
100%
Physical Stimulus
28%
Front End
14%
Integrated Circuit Design
14%
Manufacturing Cost
14%
Fast Fourier Transform
14%
Major Part
14%
Computational Complexity
14%
Processor Core
14%
Analog Front
14%
Phase Shift
14%