Adaptive accelerated aging with 28nm HKMG technology

Devyani Patra, Ahmed Kamal Reza, Mohammed Khaled Hassan, Mehdi Katoozi, Ethan H. Cannon, Kaushik Roy, Yu Cao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations


Device and circuit reliability analysis lacks a direct validation of the lifetime. Usually, aging in devices is extrapolated from a short-Term measurement, resulting in unreliable prediction of the end of lifetime (EOL). This work aims at providing a new approach to test the device to the end of lifetime in a fast and controllable manner. The contributions of this work include: (1) Introducing a test methodology called Adaptive Accelerated Aging (AAA), (2) Providing test conditions for multiple stress conditions, including those for achieving EOL in 1 hour, and (3) Presenting simulation and test results at 28nm to validate the proposed methodology.

Original languageEnglish (US)
Title of host publication2017 International Reliability Physics Symposium, IRPS 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509066407
StatePublished - May 30 2017
Event2017 International Reliability Physics Symposium, IRPS 2017 - Monterey, United States
Duration: Apr 2 2017Apr 6 2017

Publication series

NameIEEE International Reliability Physics Symposium Proceedings
ISSN (Print)1541-7026


Other2017 International Reliability Physics Symposium, IRPS 2017
Country/TerritoryUnited States


  • Accelerated Aging
  • Aging
  • EOL
  • HCI
  • NBTI
  • PBTI
  • TDDB

ASJC Scopus subject areas

  • General Engineering


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