Accelerated irradiation method to study synergy sffects in bipolar integrated circuits

Nicolas Jean Henri Roche; Yago Gonzalez Velo; Laurent Dusseau; Jérôme Boch; Jean Roch Vaillé; Frédéric Saigné; Bruno Azais; Gérard Auriel; Eric Lorfèvre; Vincent Pouget; Stephen P. Buchner; Jean Pierre David; Ronan Marec; Philippe Calvel

doi:10.1109/TNS.2009.2015313

Accelerated irradiation method to study synergy sffects in bipolar integrated circuits

Nicolas Jean Henri Roche
, Yago Gonzalez Velo
, Laurent Dusseau
, Jérôme Boch
, Jean Roch Vaillé
, Frédéric Saigné
, Bruno Azais
, Gérard Auriel
, Eric Lorfèvre
, Vincent Pouget
, Stephen P. Buchner
, Jean Pierre David
, Ronan Marec
, Philippe Calvel

Research output: Contribution to journal › Article › peer-review

25 Scopus citations

Abstract

An accelerated irradiation technique is used to study dose-ASET synergy effects. The impact of TID on SET is found to be identical when the dose rate is switched from high to low or from low to high.

Original language	English (US)
Article number	5204685
Pages (from-to)	1971-1977
Number of pages	7
Journal	IEEE Transactions on Nuclear Science
Volume	56
Issue number	4
DOIs	https://doi.org/10.1109/TNS.2009.2015313
State	Published - Aug 2009
Externally published	Yes

Keywords

Analog single event transient
Bipolar analog integrated circuits
Pulsed-laser testing
Total ionizing dose

ASJC Scopus subject areas

Nuclear and High Energy Physics
Nuclear Energy and Engineering
Electrical and Electronic Engineering

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10.1109/TNS.2009.2015313

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Roche, N. J. H., Gonzalez Velo, Y., Dusseau, L., Boch, J., Vaillé, J. R., Saigné, F., Azais, B., Auriel, G., Lorfèvre, E., Pouget, V., Buchner, S. P., David, J. P., Marec, R., & Calvel, P. (2009). Accelerated irradiation method to study synergy sffects in bipolar integrated circuits. IEEE Transactions on Nuclear Science, 56(4), 1971-1977. Article 5204685. https://doi.org/10.1109/TNS.2009.2015313

Roche, NJH, Gonzalez Velo, Y, Dusseau, L, Boch, J, Vaillé, JR, Saigné, F, Azais, B, Auriel, G, Lorfèvre, E, Pouget, V, Buchner, SP, David, JP, Marec, R & Calvel, P 2009, 'Accelerated irradiation method to study synergy sffects in bipolar integrated circuits', IEEE Transactions on Nuclear Science, vol. 56, no. 4, 5204685, pp. 1971-1977. https://doi.org/10.1109/TNS.2009.2015313

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title = "Accelerated irradiation method to study synergy sffects in bipolar integrated circuits",

abstract = "An accelerated irradiation technique is used to study dose-ASET synergy effects. The impact of TID on SET is found to be identical when the dose rate is switched from high to low or from low to high.",

keywords = "Analog single event transient, Bipolar analog integrated circuits, Pulsed-laser testing, Total ionizing dose",

author = "Roche, \{Nicolas Jean Henri\} and \{Gonzalez Velo\}, Yago and Laurent Dusseau and J{\'e}r{\^o}me Boch and Vaill{\'e}, \{Jean Roch\} and Fr{\'e}d{\'e}ric Saign{\'e} and Bruno Azais and G{\'e}rard Auriel and Eric Lorf{\`e}vre and Vincent Pouget and Buchner, \{Stephen P.\} and David, \{Jean Pierre\} and Ronan Marec and Philippe Calvel",

note = "Funding Information: Manuscript received September 08, 2008; revised December 19, 2008. Current version published August 12, 2009. This work was supported in part by the The Centre National d{\textquoteright}Etudes Spatiales and in part by the Delegation G{\'e}n{\'e}rale pour l{\textquoteright}Armement.",

year = "2009",

month = aug,

doi = "10.1109/TNS.2009.2015313",

language = "English (US)",

volume = "56",

pages = "1971--1977",

journal = "IEEE Transactions on Nuclear Science",

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T1 - Accelerated irradiation method to study synergy sffects in bipolar integrated circuits

AU - Roche, Nicolas Jean Henri

AU - Gonzalez Velo, Yago

AU - Dusseau, Laurent

AU - Boch, Jérôme

AU - Vaillé, Jean Roch

AU - Saigné, Frédéric

AU - Azais, Bruno

AU - Auriel, Gérard

AU - Lorfèvre, Eric

AU - Pouget, Vincent

AU - Buchner, Stephen P.

AU - David, Jean Pierre

AU - Marec, Ronan

AU - Calvel, Philippe

N1 - Funding Information: Manuscript received September 08, 2008; revised December 19, 2008. Current version published August 12, 2009. This work was supported in part by the The Centre National d’Etudes Spatiales and in part by the Delegation Générale pour l’Armement.

PY - 2009/8

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N2 - An accelerated irradiation technique is used to study dose-ASET synergy effects. The impact of TID on SET is found to be identical when the dose rate is switched from high to low or from low to high.

AB - An accelerated irradiation technique is used to study dose-ASET synergy effects. The impact of TID on SET is found to be identical when the dose rate is switched from high to low or from low to high.

KW - Analog single event transient

KW - Bipolar analog integrated circuits

KW - Pulsed-laser testing

KW - Total ionizing dose

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SP - 1971

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JO - IEEE Transactions on Nuclear Science

JF - IEEE Transactions on Nuclear Science

IS - 4

M1 - 5204685

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Accelerated irradiation method to study synergy sffects in bipolar integrated circuits

Abstract

Keywords

ASJC Scopus subject areas

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