A TPM-Inspired Factory Throughput Analysis Tool

J. Konopka; John Fowler

doi:10.1109/ISSM.1994.729425

A TPM-Inspired Factory Throughput Analysis Tool

J. Konopka, John Fowler

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Abstract

The throughput of a factory is constrained by its bottleneck tools. TPM is a methodology that can be used to improve the efficiencies and thus the throughputs of these bottleneck tools. CUBES is a model that helps identify where improvements can be made and how much benefit can be gained from each improvement. If all bottlenecks are analyzed together, factory level throughput improvements can be made.

Original language	English (US)
Article number	729425
Pages (from-to)	64-67
Number of pages	4
Journal	IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings
DOIs	https://doi.org/10.1109/ISSM.1994.729425
State	Published - Jan 1 1994
Externally published	Yes
Event	1994 International Symposium on Semiconductor Manufacturing, ISSM 1994 - Tokyo, Japan Duration: Jun 21 1994 → Jun 22 1994

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

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10.1109/ISSM.1994.729425

Cite this

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title = "A TPM-Inspired Factory Throughput Analysis Tool",

abstract = "The throughput of a factory is constrained by its bottleneck tools. TPM is a methodology that can be used to improve the efficiencies and thus the throughputs of these bottleneck tools. CUBES is a model that helps identify where improvements can be made and how much benefit can be gained from each improvement. If all bottlenecks are analyzed together, factory level throughput improvements can be made.",

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year = "1994",

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doi = "10.1109/ISSM.1994.729425",

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AU - Fowler, John

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AB - The throughput of a factory is constrained by its bottleneck tools. TPM is a methodology that can be used to improve the efficiencies and thus the throughputs of these bottleneck tools. CUBES is a model that helps identify where improvements can be made and how much benefit can be gained from each improvement. If all bottlenecks are analyzed together, factory level throughput improvements can be made.

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JO - IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings

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A TPM-Inspired Factory Throughput Analysis Tool

Abstract

ASJC Scopus subject areas

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