Abstract
Design and construction details are given for a scanning tunneling microscope which fits inside a side-entry holder for transmission electron microscopes, operated in the reflection mode. The instrument is intended to improve our understanding of the mechanisms of STM imaging, and to act as a prototype for the development of an ultra-high vacuum instrument.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 165-169 |
| Number of pages | 5 |
| Journal | Ultramicroscopy |
| Volume | 25 |
| Issue number | 2 |
| DOIs | |
| State | Published - 1988 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation