A novel technique for performing PID susceptibility screening during the solar cell fabrication process

Jaewon Oh; Som Dahal; Bill Dauksher; Stuart Bowden; Govindasamy Tamizhmani; Peter Hacke

doi:10.1109/PVSC.2016.7749741

A novel technique for performing PID susceptibility screening during the solar cell fabrication process

Jaewon Oh, Som Dahal, Bill Dauksher, Stuart Bowden, Govindasamy Tamizhmani, Peter Hacke

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Scopus citations

Abstract

Various characterization techniques have historically been developed in order to screen potential induced degradation (PID)-susceptible cells, but those techniques require final solar cells. We present a new characterization technique for screening PID-susceptible cells during the cell fabrication process. Illuminated Lock-In Thermography (ILIT) was used to image PID shunting of the cell without metallization and clearly showed PID-affected areas. PID-susceptible cells can be screened by ILIT, and the sample structure can advantageously be simplified as long as the sample has the silicon nitride antireflection coating and an aluminum back surface field.

Original language	English (US)
Title of host publication	2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	907-910
Number of pages	4
Volume	2016-November
ISBN (Electronic)	9781509027248
DOIs	https://doi.org/10.1109/PVSC.2016.7749741
State	Published - Nov 18 2016
Event	43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States Duration: Jun 5 2016 → Jun 10 2016

Other

Other	43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
Country/Territory	United States
City	Portland
Period	6/5/16 → 6/10/16

Keywords

electroluminescence
lock-in thermography
photovoltaic cells
PID
reliability
silicon

ASJC Scopus subject areas

Control and Systems Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/PVSC.2016.7749741

Cite this

Oh, J., Dahal, S., Dauksher, B., Bowden, S., Tamizhmani, G., & Hacke, P. (2016). A novel technique for performing PID susceptibility screening during the solar cell fabrication process. In 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016 (Vol. 2016-November, pp. 907-910). Article 7749741 Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2016.7749741

A novel technique for performing PID susceptibility screening during the solar cell fabrication process. / Oh, Jaewon; Dahal, Som; Dauksher, Bill et al.
2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016. Vol. 2016-November Institute of Electrical and Electronics Engineers Inc., 2016. p. 907-910 7749741.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Oh, J, Dahal, S, Dauksher, B, Bowden, S, Tamizhmani, G & Hacke, P 2016, A novel technique for performing PID susceptibility screening during the solar cell fabrication process. in 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016. vol. 2016-November, 7749741, Institute of Electrical and Electronics Engineers Inc., pp. 907-910, 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016, Portland, United States, 6/5/16. https://doi.org/10.1109/PVSC.2016.7749741

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title = "A novel technique for performing PID susceptibility screening during the solar cell fabrication process",

abstract = "Various characterization techniques have historically been developed in order to screen potential induced degradation (PID)-susceptible cells, but those techniques require final solar cells. We present a new characterization technique for screening PID-susceptible cells during the cell fabrication process. Illuminated Lock-In Thermography (ILIT) was used to image PID shunting of the cell without metallization and clearly showed PID-affected areas. PID-susceptible cells can be screened by ILIT, and the sample structure can advantageously be simplified as long as the sample has the silicon nitride antireflection coating and an aluminum back surface field.",

keywords = "electroluminescence, lock-in thermography, photovoltaic cells, PID, reliability, silicon",

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AU - Tamizhmani, Govindasamy

AU - Hacke, Peter

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AB - Various characterization techniques have historically been developed in order to screen potential induced degradation (PID)-susceptible cells, but those techniques require final solar cells. We present a new characterization technique for screening PID-susceptible cells during the cell fabrication process. Illuminated Lock-In Thermography (ILIT) was used to image PID shunting of the cell without metallization and clearly showed PID-affected areas. PID-susceptible cells can be screened by ILIT, and the sample structure can advantageously be simplified as long as the sample has the silicon nitride antireflection coating and an aluminum back surface field.

KW - electroluminescence

KW - lock-in thermography

KW - photovoltaic cells

KW - PID

KW - reliability

KW - silicon

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A novel technique for performing PID susceptibility screening during the solar cell fabrication process

Abstract

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Keywords

ASJC Scopus subject areas

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