Abstract
This paper presents a multi-scale modelling approach to investigate the underpinning mechanisms of microstructure-sensitive damage of single crystal Sn-3Ag-0.5Cu (wt%, SAC305) solder joints of a Ball Grid Array (BGA) board assembly subject to thermal cycling. The multi-scale scheme couples board-scale modelling at the continuum macro-scale and individual solder modelling at the crystal micro-scale. Systematic studies of tin crystal orientation and its role in fatigue damage have been compared to experimental observations. Crystallographic orientation is examined with respect to damage development, providing evidence-based optimal solder microstructural design for in-service thermomechanical fatigue.
| Original language | English (US) |
|---|---|
| Article number | 103308 |
| Journal | International Journal of Plasticity |
| Volume | 155 |
| DOIs | |
| State | Published - Aug 2022 |
| Externally published | Yes |
Keywords
- Crystal plasticity
- Microstructure
- Multi-scale modelling
- SAC305, thermal fatigue
- Solder joints
ASJC Scopus subject areas
- General Materials Science
- Mechanics of Materials
- Mechanical Engineering