A high resolution mass spectrometer for atomic mass determinations

R. C. Barber; R. L. Bishop; H. E. Duckworth; J. O. Meredith; F. C.G. Southon; P. Van Rookhuyzen; P. Williams

doi:10.1063/1.1684832

A high resolution mass spectrometer for atomic mass determinations

R. C. Barber
, R. L. Bishop
, H. E. Duckworth
, J. O. Meredith
, F. C.G. Southon
, P. Van Rookhuyzen
, P. Williams

Research output: Contribution to journal › Article › peer-review

37 Scopus citations

Abstract

A high resolution, second-order double-focusing mass spectrometer has been constructed for the precise determination of atomic mass differences. The instrument has a mean radius of curvature in the electrostatic analyzer of 1 m and has operated with a resolving power at the base of the peaks of ∼200 000. Details of current operation are given. The best precision achieved to date is 2.5×10^-9, corresponding to ∼250 eV at M = 100 amu; typical precision is ∼5×10^-9.

Original language	English (US)
Pages (from-to)	1-8
Number of pages	8
Journal	Review of Scientific Instruments
Volume	42
Issue number	1
DOIs	https://doi.org/10.1063/1.1684832
State	Published - 1971
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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10.1063/1.1684832

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title = "A high resolution mass spectrometer for atomic mass determinations",

abstract = "A high resolution, second-order double-focusing mass spectrometer has been constructed for the precise determination of atomic mass differences. The instrument has a mean radius of curvature in the electrostatic analyzer of 1 m and has operated with a resolving power at the base of the peaks of ∼200 000. Details of current operation are given. The best precision achieved to date is 2.5×10-9, corresponding to ∼250 eV at M = 100 amu; typical precision is ∼5×10-9.",

author = "Barber, \{R. C.\} and Bishop, \{R. L.\} and Duckworth, \{H. E.\} and Meredith, \{J. O.\} and Southon, \{F. C.G.\} and \{Van Rookhuyzen\}, P. and P. Williams",

year = "1971",

doi = "10.1063/1.1684832",

language = "English (US)",

volume = "42",

pages = "1--8",

journal = "Review of Scientific Instruments",

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publisher = "American Institute of Physics",

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T1 - A high resolution mass spectrometer for atomic mass determinations

AU - Barber, R. C.

AU - Bishop, R. L.

AU - Duckworth, H. E.

AU - Meredith, J. O.

AU - Southon, F. C.G.

AU - Van Rookhuyzen, P.

AU - Williams, P.

PY - 1971

Y1 - 1971

N2 - A high resolution, second-order double-focusing mass spectrometer has been constructed for the precise determination of atomic mass differences. The instrument has a mean radius of curvature in the electrostatic analyzer of 1 m and has operated with a resolving power at the base of the peaks of ∼200 000. Details of current operation are given. The best precision achieved to date is 2.5×10-9, corresponding to ∼250 eV at M = 100 amu; typical precision is ∼5×10-9.

AB - A high resolution, second-order double-focusing mass spectrometer has been constructed for the precise determination of atomic mass differences. The instrument has a mean radius of curvature in the electrostatic analyzer of 1 m and has operated with a resolving power at the base of the peaks of ∼200 000. Details of current operation are given. The best precision achieved to date is 2.5×10-9, corresponding to ∼250 eV at M = 100 amu; typical precision is ∼5×10-9.

UR - https://www.scopus.com/pages/publications/0001632563

UR - https://www.scopus.com/pages/publications/0001632563#tab=citedBy

U2 - 10.1063/1.1684832

DO - 10.1063/1.1684832

M3 - Article

AN - SCOPUS:0001632563

SN - 0034-6748

VL - 42

SP - 1

EP - 8

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 1

ER -

A high resolution mass spectrometer for atomic mass determinations

Abstract

ASJC Scopus subject areas

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