A GLM approach to optimal ALT test plans for weibull distribution with type-i censoring

Rong Pan, Tao Yang

Research output: Chapter in Book/Report/Conference proceedingConference contribution


The aim of this paper is to derive the methodology for planning an optimal accelerated life test with the consideration of type-I censoring. In a typical industrial setting, the total duration of ALT tests must be controlled as failure times are random in nature. The generalized linear model approach allows optimal designs to be found using iteratively weighted least squares solution without directly calculating the expected Fisher information matrix, which is often intractable in the case of censoring. This approach is demonstrated with an assumed Weibull distribution. We discuss both D-optimal design, where the determinant of variance-covariance matrix of model parameters is minimized, and U C -optimal design, where the prediction variance of lifetime at a product's use condition is minimized.

Original languageEnglish (US)
Title of host publicationSAE Technical Papers
StatePublished - 2011
EventSAE 2011 World Congress and Exhibition - Detroit, MI, United States
Duration: Apr 12 2011Apr 14 2011


OtherSAE 2011 World Congress and Exhibition
Country/TerritoryUnited States
CityDetroit, MI


  • Censoring
  • Keywords Accelerated life testing
  • Optimal test plans
  • Weibull distribution

ASJC Scopus subject areas

  • Automotive Engineering
  • Safety, Risk, Reliability and Quality
  • Pollution
  • Industrial and Manufacturing Engineering


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