A comprehensive study of enhanced characteristics with localized transition in interface-type vanadium-based devices

  • C. Y. Lin
  • , P. H. Chen
  • , T. C. Chang
  • , W. C. Huang
  • , Y. F. Tan
  • , Y. H. Lin
  • , W. C. Chen
  • , C. C. Lin
  • , Y. F. Chang
  • , Y. C. Chen
  • , H. C. Huang
  • , X. H. Ma
  • , Y. Hao
  • , S. M. Sze

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

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Keyphrases

Engineering

Material Science