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Material Science
Activation Energy
9%
Annealing
6%
Anode
10%
Capacitance
5%
Cathode
8%
Chalcogenides
51%
Chalcogenides Glass
57%
Cobalt
11%
Conductive Film
8%
Conductor
16%
Density
14%
Device Type
5%
Dielectric Spectroscopy
11%
Doping (Additives)
8%
Electrical Resistivity
7%
Electrodeposition
17%
Electronic Circuit
59%
Film
98%
Germanium
16%
Lithography
8%
Metal-Oxide-Semiconductor Field-Effect Transistor
20%
Microelectromechanical System
7%
Monolayers
19%
Nanostructure
16%
Neuromorphic Computing
9%
Oxide Compound
40%
Photosensor
6%
Raman Spectroscopy
14%
Reactive Ion Etching
5%
Redox Process
13%
Resistive Random-Access Memory
15%
Scanning Electron Microscopy
11%
Secondary Ion Mass Spectrometry
7%
Self Assembled Monolayer
10%
Self Assembly
6%
Semiconductor Device
5%
Silicide
10%
Silicon
44%
Silicon Dioxide
30%
Silver
29%
Silver Ion
12%
Solar Cell
8%
Solid Electrolyte
81%
Sulfide
5%
Thermal Diffusion
11%
Thin Films
52%
Thioether
5%
Transistor
7%
Tungsten
8%
X-Ray Diffraction
18%
Keyphrases
Ag-Ge
22%
Annealing
10%
Cell Memory
17%
Cellular Device
22%
Cellular Technology
10%
Chalcogenide Glass Film
12%
Chalcogenide Glasses
31%
Chalcogenides
17%
Conductive Bridging Random Access Memory (CBRAM)
49%
Conductive Filament
8%
Cu-SiO2
27%
Dendrite
8%
Device-independent
21%
Electrodeposit
28%
Electrodeposition
9%
Electrolyte
18%
GeSe
44%
High Resistance State
15%
Integrated Circuits
9%
Ion Transport
10%
Ionizing Radiation
11%
Lateral Diffusion
10%
Low Resistance State
12%
Low Voltage
13%
Memory Cell
16%
Memory Device
25%
Memory Technologies
11%
Memory-based
10%
Metal Ions
8%
MOSFET
13%
Nanostructures
11%
Non-volatile
10%
Non-volatile Memory
20%
Nonvolatile Memory Technologies
9%
On-state
8%
Oxides
8%
Oxidizable
8%
Photodiffusion
10%
Programmable Metallization Cell
100%
Radiation Effects
17%
Resistance Switching
12%
Resistive Random Access Memory (ReRAM)
23%
Resistive State
10%
Silica
26%
Silicon Dioxide
9%
Solid Electrolyte
41%
Switching Characteristics
10%
Threshold Voltage
9%
Total Ionizing Dose
27%
Vapor Etching
8%
Engineering
Bridging
9%
Cleanroom
5%
Conductive
30%
Current Drain
5%
Diaphragm
9%
Directional
9%
Directionality
7%
Directivity Index
5%
Dopants
7%
Field-Effect Transistor
5%
High Resistance State
5%
High Resolution
6%
Hydrophobicity
7%
Integrated Circuit
17%
Interconnects
5%
Junction Depth
6%
Limitations
5%
Lithography
8%
Memory Array
6%
Metal-Oxide-Semiconductor Field-Effect Transistor
18%
Metallizations
7%
Micro-Electro-Mechanical System
5%
Microchannel
5%
Microelectromechanical System
5%
Molecular Layer
6%
Nanomaterial
9%
Nanoscale
21%
Nonvolatile Memory
21%
Photometer
5%
Photoresist
6%
Potential Application
5%
Programmable Metallization Cell
16%
Random Access Memory
11%
Random Access Memory Device
7%
Resistance Change
6%
Resistive
23%
Room Temperature
11%
Shallow Junction
5%
Sheet Resistance
5%
Silicon Dioxide
34%
Silver Ion
5%
Solar Cell
8%
Test Structure
5%
Thin Films
9%
Transistor
6%
